RixsToolBox: software for the analysis of soft X-ray RIXS data acquired with 2D detectors

@article{ ISI:000395093600021,
Author = {Kummer, K. and Tamborrino, A. and Amorese, A. and Minola, M. and
   Braicovich, L. and Brookes, N. B. and Ghiringhelli, G.},
Title = {{RixsToolBox: software for the analysis of soft X-ray RIXS data acquired
   with 2D detectors}},
Journal = {{JOURNAL OF SYNCHROTRON RADIATION}},
Year = {{2017}},
Volume = {{24}},
Number = {{2}},
Pages = {{531-536}},
Month = {{MAR}},
Abstract = {{A software with a graphical user interface has been developed with the
   aim of facilitating the data analysis for users of a new resonant
   inelastic X-ray scattering (RIXS) spectrometer installed at the ESRF
   beamline ID32. The software is organized in modules covering all
   relevant steps in the data reduction from a stack of several hundred
   two-dimensional CCD images to a single RIXS spectrum. It utilizes both
   full charge integration and single-photon centroiding to cope with
   high-flux and high-resolution requirements. Additional modules for
   further data analysis and the extraction of instrumental parameters are
   available. The software has been in routine use for about a year now and
   in that time many additional features have been incorporated. It now
   meets the users' need for an easy-to-use data analysis tool that allows
   looking at and understanding data as it is acquired and thus steering
   users' experiments more efficiently.}},
Publisher = {{INT UNION CRYSTALLOGRAPHY}},
Address = {{2 ABBEY SQ, CHESTER, CH1 2HU, ENGLAND}},
Type = {{Article}},
Language = {{English}},
Affiliation = {{Kummer, K (Corresponding Author), European Synchrotron Radiat Facil, 71 Ave Martyrs, F-38043 Grenoble 9, France.
   Kummer, K.; Tamborrino, A.; Amorese, A.; Brookes, N. B., European Synchrotron Radiat Facil, 71 Ave Martyrs, F-38043 Grenoble 9, France.
   Tamborrino, A.; Minola, M.; Braicovich, L.; Ghiringhelli, G., Politecn Milan, CNR, SPIN, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy.
   Tamborrino, A.; Minola, M.; Braicovich, L.; Ghiringhelli, G., Politecn Milan, Dipartimento Fis, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy.
   Minola, M., Max Planck Inst Festkorperforsch, Heisenbergstr 1, D-70569 Stuttgart, Germany.}},
DOI = {{10.1107/S1600577517000832}},
ISSN = {{1600-5775}},
Keywords = {{RixsToolBox; resonant inelastic X-ray scattering; RIXS; software; ESRF}},
Research-Areas = {{Instruments & Instrumentation; Optics; Physics}},
Web-of-Science-Categories  = {{Instruments & Instrumentation; Optics; Physics, Applied}},
Author-Email = {{kurt.kummer@esrf.fr}},
ResearcherID-Numbers = {{Brookes, Nicholas B/C-6718-2019
   Amorese, Andrea/AAA-7510-2020
   Ghiringhelli, Giacomo/D-1159-2014
   }},
ORCID-Numbers = {{Brookes, Nicholas B/0000-0002-1342-9530
   Ghiringhelli, Giacomo/0000-0003-0867-7748
   Minola, Matteo/0000-0003-4084-0664
   Braicovich, Lucio/0000-0001-6548-9140}},
Number-of-Cited-References = {{6}},
Times-Cited = {{3}},
Usage-Count-Last-180-days = {{0}},
Usage-Count-Since-2013 = {{9}},
Journal-ISO = {{J. Synchrot. Radiat.}},
Doc-Delivery-Number = {{EM1RB}},
Unique-ID = {{ISI:000395093600021}},
OA = {{Other Gold, Green Published}},
DA = {{2020-12-22}},
}