Direct tomography imaging for inelastic X-ray scattering experiments at high pressure

@article{ ISI:000391724900026,
Author = {Sahle, Ch. J. and Rosa, A. D. and Rossi, M. and Cerantola, V. and
   Spiekermann, G. and Petitgirard, S. and Jacobs, J. and Huotari, S. and
   Sala, M. Moretti and Mirone, A.},
Title = {{Direct tomography imaging for inelastic X-ray scattering experiments at
   high pressure}},
Journal = {{JOURNAL OF SYNCHROTRON RADIATION}},
Year = {{2017}},
Volume = {{24}},
Number = {{1}},
Pages = {{269-275}},
Month = {{JAN}},
Abstract = {{A method to separate the non-resonant inelastic X-ray scattering signal
   of a micro-metric sample contained inside a diamond anvil cell (DAC)
   from the signal originating from the high-pressure sample environment is
   described. Especially for high-pressure experiments, the parasitic
   signal originating from the diamond anvils, the gasket and/or the
   pressure medium can easily obscure the sample signal or even render the
   experiment impossible. Another severe complication for high-pressure
   non-resonant inelastic X-ray measurements, such as X-ray Raman
   scattering spectroscopy, can be the proximity of the desired sample edge
   energy to an absorption edge energy of elements constituting the DAC. It
   is shown that recording the scattered signal in a spatially resolved
   manner allows these problems to be overcome by separating the sample
   signal from the spurious scattering of the DAC without constraints on
   the solid angle of detection. Furthermore, simple machine learning
   algorithms facilitate finding the corresponding detector pixels that
   record the sample signal. The outlined experimental technique and data
   analysis approach are demonstrated by presenting spectra of the Si
   L-2,L-3-edge and O K-edge of compressed alpha-quartz. The spectra are of
   unprecedented quality and both the O K-edge and the Si L-2,L-3-edge
   clearly show the existence of a pressure-induced phase transition
   between 10 and 24 GPa.}},
Publisher = {{INT UNION CRYSTALLOGRAPHY}},
Address = {{2 ABBEY SQ, CHESTER, CH1 2HU, ENGLAND}},
Type = {{Article}},
Language = {{English}},
Affiliation = {{Sahle, CJ (Corresponding Author), European Synchrotron Radiat Facil, 71 Ave Martyrs, F-38000 Grenoble, France.
   Sahle, Ch. J.; Rosa, A. D.; Rossi, M.; Cerantola, V.; Jacobs, J.; Sala, M. Moretti; Mirone, A., European Synchrotron Radiat Facil, 71 Ave Martyrs, F-38000 Grenoble, France.
   Spiekermann, G., Univ Potsdam, Inst Earth & Environm Sci, Potsdam, Germany.
   Petitgirard, S., Univ Bayreuth, Bayer Geoinst, Bayreuth, Germany.
   Huotari, S., Univ Helsinki, Dept Phys, POB 64, FI-00014 Helsinki, Finland.}},
DOI = {{10.1107/S1600577516017100}},
ISSN = {{1600-5775}},
Keywords = {{inelastic X-ray scattering; direct tomography; diamond anvil cell; high
   pressure}},
Keywords-Plus = {{RAMAN-SCATTERING; ELECTRONIC-STRUCTURE; IN-SITU; SPECTROSCOPY; GLASS;
   AMORPHIZATION; TEMPERATURE; EXCITATIONS; SPECTRA; SILICA}},
Research-Areas = {{Instruments & Instrumentation; Optics; Physics}},
Web-of-Science-Categories  = {{Instruments & Instrumentation; Optics; Physics, Applied}},
Author-Email = {{christoph.sahle@esrf.fr}},
ResearcherID-Numbers = {{Moretti, Marco/AAF-9255-2019
   Rosa, Angelika/AAF-9779-2019
   Sahle, Christoph/T-1326-2017
   Cerantola, Valerio/ABD-4092-2020
   Sahle, Christoph/P-6715-2019
   Sala, Marco Moretti/H-1034-2014
   }},
ORCID-Numbers = {{Moretti, Marco/0000-0002-9744-9976
   Sahle, Christoph/0000-0001-8645-3163
   Cerantola, Valerio/0000-0002-2808-2963
   Sahle, Christoph/0000-0001-8645-3163
   Sala, Marco Moretti/0000-0002-9744-9976
   Rosa, Angelika/0000-0002-2304-1943
   Huotari, Simo/0000-0003-4506-8722
   Rossi, Matteo/0000-0002-4254-0713}},
Number-of-Cited-References = {{51}},
Times-Cited = {{10}},
Usage-Count-Last-180-days = {{0}},
Usage-Count-Since-2013 = {{20}},
Journal-ISO = {{J. Synchrot. Radiat.}},
Doc-Delivery-Number = {{EH4ES}},
Unique-ID = {{ISI:000391724900026}},
OA = {{Green Published, Other Gold}},
DA = {{2020-12-22}},
}