Graded multilayers for fully polarization resolved Resonant Inelastic X-ray Scattering in the soft x-ray range

@inproceedings{ ISI:000343877600017,
Author = {Morawe, Ch. and Peffen, J-Ch. and Supruangnet, R. and Braicovich, L. and
   Brookes, N. B. and Ghiringhelli, G. and Yakhou-Harris, F.},
Editor = {{Morawe, C and Khounsary, AM and Goto, S}},
Title = {{Graded multilayers for fully polarization resolved Resonant Inelastic
   X-ray Scattering in the soft x-ray range}},
Booktitle = {{ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS IX}},
Series = {{Proceedings of SPIE}},
Year = {{2014}},
Volume = {{9207}},
Note = {{Conference on Advances in X-Ray/EUV Optics and Components IX held as
   part of the SPIE 2014 International Symposium on Optics + Photonics, San
   Diego, CA, AUG 18-20, 2014}},
Organization = {{SPIE}},
Abstract = {{On the upgraded ESRF soft x-ray beamline ID32 a new spectrometer for
   Resonant X-ray Inelastic Scattering (RIXS) will be installed. To operate
   in fully polarized mode, a polarimeter will be inserted in the
   instrument to measure simultaneously the energy spectra and the linear
   polarization. The new spectrometer works between 500 eV and 1000 eV and
   requires graded multilayers to optimize the energy tunability and the
   polarization sensitivity. The present work covers the design, the
   fabrication, and the characterization of the multilayers. Performance
   evaluations during test and commissioning experiments with soft x-rays
   complement the paper.}},
Publisher = {{SPIE-INT SOC OPTICAL ENGINEERING}},
Address = {{1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA}},
Type = {{Proceedings Paper}},
Language = {{English}},
Affiliation = {{Morawe, C (Corresponding Author), ESRF, Grenoble, France.
   Morawe, Ch.; Peffen, J-Ch.; Brookes, N. B.; Yakhou-Harris, F., ESRF, Grenoble, France.
   Supruangnet, R., CSPIN & Politecnico, Milan, Italy.
   Braicovich, L.; Ghiringhelli, G., CSPIN & Politecnico Milano, Milan, Italy.}},
DOI = {{10.1117/12.2061827}},
Article-Number = {{92070J}},
ISSN = {{0277-786X}},
EISSN = {{1996-756X}},
ISBN = {{978-1-62841-234-5}},
Keywords = {{x-ray optics; x-ray multilayers; sputter deposition; x-ray polarization
   analyzer}},
Research-Areas = {{Optics; Physics}},
Web-of-Science-Categories  = {{Optics; Physics, Applied}},
ResearcherID-Numbers = {{Brookes, Nicholas B/C-6718-2019
   Ghiringhelli, Giacomo/D-1159-2014
   }},
ORCID-Numbers = {{Brookes, Nicholas B/0000-0002-1342-9530
   Ghiringhelli, Giacomo/0000-0003-0867-7748
   Braicovich, Lucio/0000-0001-6548-9140}},
Number-of-Cited-References = {{6}},
Times-Cited = {{2}},
Usage-Count-Last-180-days = {{0}},
Usage-Count-Since-2013 = {{10}},
Doc-Delivery-Number = {{BB5HS}},
Unique-ID = {{ISI:000343877600017}},
DA = {{2020-12-22}},
}