by Honkanen, Ari-Pekka, Verbeni, Roberto, Simonelli, Laura, Sala, Marco Moretti, Monaco, Giulio and Huotari, Simo
Abstract:
Theoretical and experimental studies are presented on properties of spherically bent analyser crystals for high-resolution X-ray spectrometry. A correction to the bent-crystal strain field owing to its finite surface area is derived. The results are used to explain the reflectivity curves and anisotropic properties of Si(660) and Si(553) analysers in near-backscattering geometry. The results from the calculation agree very well with experimental results obtained using an inelastic X-ray scattering synchrotron beamline.
Reference:
Study on the reflectivity properties of spherically bent analyser crystals (Honkanen, Ari-Pekka, Verbeni, Roberto, Simonelli, Laura, Sala, Marco Moretti, Monaco, Giulio and Huotari, Simo), In JOURNAL OF SYNCHROTRON RADIATION, INT UNION CRYSTALLOGRAPHY, volume 21, 2014.
Bibtex Entry:
@article{ ISI:000328939400013,
Author = {Honkanen, Ari-Pekka and Verbeni, Roberto and Simonelli, Laura and Sala,
   Marco Moretti and Monaco, Giulio and Huotari, Simo},
Title = {{Study on the reflectivity properties of spherically bent analyser
   crystals}},
Journal = {{JOURNAL OF SYNCHROTRON RADIATION}},
Year = {{2014}},
Volume = {{21}},
Number = {{1}},
Pages = {{104-110}},
Month = {{JAN}},
Abstract = {{Theoretical and experimental studies are presented on properties of
   spherically bent analyser crystals for high-resolution X-ray
   spectrometry. A correction to the bent-crystal strain field owing to its
   finite surface area is derived. The results are used to explain the
   reflectivity curves and anisotropic properties of Si(660) and Si(553)
   analysers in near-backscattering geometry. The results from the
   calculation agree very well with experimental results obtained using an
   inelastic X-ray scattering synchrotron beamline.}},
Publisher = {{INT UNION CRYSTALLOGRAPHY}},
Address = {{2 ABBEY SQ, CHESTER, CH1 2HU, ENGLAND}},
Type = {{Article}},
Language = {{English}},
Affiliation = {{Honkanen, AP (Corresponding Author), Dept Phys, POB 64, FI-00014 Helsinki, Finland.
   Honkanen, Ari-Pekka; Huotari, Simo, Dept Phys, FI-00014 Helsinki, Finland.
   Verbeni, Roberto; Simonelli, Laura; Sala, Marco Moretti; Monaco, Giulio, European Synchrotron Radiat Facil, F-38043 Grenoble, France.
   Monaco, Giulio, Univ Trento, Dept Phys, I-38123 Povo, TN, Italy.}},
DOI = {{10.1107/S160057751302242X}},
ISSN = {{0909-0495}},
EISSN = {{1600-5775}},
Keywords = {{high-energy-resolution analysers; inelastic X-ray scattering; bent
   crystals}},
Keywords-Plus = {{X-RAY-SCATTERING; DYNAMICAL THEORY; DIFFRACTION; SPECTROMETER;
   RESOLUTION; SPECTROSCOPY; SPECTRA}},
Research-Areas = {{Instruments & Instrumentation; Optics; Physics}},
Web-of-Science-Categories  = {{Instruments & Instrumentation; Optics; Physics, Applied}},
Author-Email = {{ari-pekka.honkanen@helsinki.fi}},
ResearcherID-Numbers = {{Monaco, Giulio/AAW-4387-2020
   Simonelli, Laura/I-1963-2015
   Moretti, Marco/AAF-9255-2019
   Sala, Marco Moretti/H-1034-2014
   }},
ORCID-Numbers = {{Monaco, Giulio/0000-0003-2497-6422
   Moretti, Marco/0000-0002-9744-9976
   Sala, Marco Moretti/0000-0002-9744-9976
   Honkanen, Ari-Pekka/0000-0002-6822-3062
   Huotari, Simo/0000-0003-4506-8722}},
Funding-Acknowledgement = {{Academy of FinlandAcademy of Finland {[}1256211, 1254065]; University of
   Helsinki {[}490076]}},
Funding-Text = {{We are grateful to C. Henriquet for expert advice and assistance. Beam
   time was provided by the European Synchrotron Radiation Facility. A-PH
   and SH were funded by the Academy of Finland (grants 1256211 and
   1254065) and University of Helsinki research funds (grant 490076).}},
Number-of-Cited-References = {{43}},
Times-Cited = {{15}},
Usage-Count-Last-180-days = {{1}},
Usage-Count-Since-2013 = {{20}},
Journal-ISO = {{J. Synchrot. Radiat.}},
Doc-Delivery-Number = {{279DD}},
Unique-ID = {{ISI:000328939400013}},
OA = {{Green Published}},
DA = {{2020-12-22}},
}

Categories:

Tags:

Comments are closed