by Honkanen, Ari-Pekka, Verbeni, Roberto, Simonelli, Laura, Sala, Marco Moretti, Monaco, Giulio and Huotari, Simo
Abstract:
Theoretical and experimental studies are presented on properties of spherically bent analyser crystals for high-resolution X-ray spectrometry. A correction to the bent-crystal strain field owing to its finite surface area is derived. The results are used to explain the reflectivity curves and anisotropic properties of Si(660) and Si(553) analysers in near-backscattering geometry. The results from the calculation agree very well with experimental results obtained using an inelastic X-ray scattering synchrotron beamline.
Reference:
Study on the reflectivity properties of spherically bent analyser crystals (Honkanen, Ari-Pekka, Verbeni, Roberto, Simonelli, Laura, Sala, Marco Moretti, Monaco, Giulio and Huotari, Simo), In JOURNAL OF SYNCHROTRON RADIATION, INT UNION CRYSTALLOGRAPHY, volume 21, 2014.
Bibtex Entry:
@article{ ISI:000328939400013, Author = {Honkanen, Ari-Pekka and Verbeni, Roberto and Simonelli, Laura and Sala, Marco Moretti and Monaco, Giulio and Huotari, Simo}, Title = {{Study on the reflectivity properties of spherically bent analyser crystals}}, Journal = {{JOURNAL OF SYNCHROTRON RADIATION}}, Year = {{2014}}, Volume = {{21}}, Number = {{1}}, Pages = {{104-110}}, Month = {{JAN}}, Abstract = {{Theoretical and experimental studies are presented on properties of spherically bent analyser crystals for high-resolution X-ray spectrometry. A correction to the bent-crystal strain field owing to its finite surface area is derived. The results are used to explain the reflectivity curves and anisotropic properties of Si(660) and Si(553) analysers in near-backscattering geometry. The results from the calculation agree very well with experimental results obtained using an inelastic X-ray scattering synchrotron beamline.}}, Publisher = {{INT UNION CRYSTALLOGRAPHY}}, Address = {{2 ABBEY SQ, CHESTER, CH1 2HU, ENGLAND}}, Type = {{Article}}, Language = {{English}}, Affiliation = {{Honkanen, AP (Corresponding Author), Dept Phys, POB 64, FI-00014 Helsinki, Finland. Honkanen, Ari-Pekka; Huotari, Simo, Dept Phys, FI-00014 Helsinki, Finland. Verbeni, Roberto; Simonelli, Laura; Sala, Marco Moretti; Monaco, Giulio, European Synchrotron Radiat Facil, F-38043 Grenoble, France. Monaco, Giulio, Univ Trento, Dept Phys, I-38123 Povo, TN, Italy.}}, DOI = {{10.1107/S160057751302242X}}, ISSN = {{0909-0495}}, EISSN = {{1600-5775}}, Keywords = {{high-energy-resolution analysers; inelastic X-ray scattering; bent crystals}}, Keywords-Plus = {{X-RAY-SCATTERING; DYNAMICAL THEORY; DIFFRACTION; SPECTROMETER; RESOLUTION; SPECTROSCOPY; SPECTRA}}, Research-Areas = {{Instruments & Instrumentation; Optics; Physics}}, Web-of-Science-Categories = {{Instruments & Instrumentation; Optics; Physics, Applied}}, Author-Email = {{ari-pekka.honkanen@helsinki.fi}}, ResearcherID-Numbers = {{Monaco, Giulio/AAW-4387-2020 Simonelli, Laura/I-1963-2015 Moretti, Marco/AAF-9255-2019 Sala, Marco Moretti/H-1034-2014 }}, ORCID-Numbers = {{Monaco, Giulio/0000-0003-2497-6422 Moretti, Marco/0000-0002-9744-9976 Sala, Marco Moretti/0000-0002-9744-9976 Honkanen, Ari-Pekka/0000-0002-6822-3062 Huotari, Simo/0000-0003-4506-8722}}, Funding-Acknowledgement = {{Academy of FinlandAcademy of Finland {[}1256211, 1254065]; University of Helsinki {[}490076]}}, Funding-Text = {{We are grateful to C. Henriquet for expert advice and assistance. Beam time was provided by the European Synchrotron Radiation Facility. A-PH and SH were funded by the Academy of Finland (grants 1256211 and 1254065) and University of Helsinki research funds (grant 490076).}}, Number-of-Cited-References = {{43}}, Times-Cited = {{15}}, Usage-Count-Last-180-days = {{1}}, Usage-Count-Since-2013 = {{20}}, Journal-ISO = {{J. Synchrot. Radiat.}}, Doc-Delivery-Number = {{279DD}}, Unique-ID = {{ISI:000328939400013}}, OA = {{Green Published}}, DA = {{2020-12-22}}, }
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