by Salluzzo, M., Ghiringhelli, G., Cezar, J. C., Brookes, N. B., De Luca, G. M., Fracassi, F. and Vaglio, R.
Abstract:
The mechanism of field-effect doping in the 123 high critical temperature superconductors (HTS) has been investigated by x-ray absorption spectroscopy in the presence of an electric field. We demonstrate that holes are created at the CuO chains of the charge reservoir and that field-effect doping of the CuO(2) planes occurs by charge transfer, from the chains to the planes, of a fraction of the overall induced holes. The electronic properties of the charge reservoir and of the dielectric-HTS interface determine the electric field doping of the CuO(2) planes.
Reference:
Indirect electric field doping of the CuO(2) planes of the cuprate NdBa(2)Cu(3)O(7) superconductor (Salluzzo, M., Ghiringhelli, G., Cezar, J. C., Brookes, N. B., De Luca, G. M., Fracassi, F. and Vaglio, R.), In PHYSICAL REVIEW LETTERS, AMER PHYSICAL SOC, volume 100, 2008.
Bibtex Entry:
@article{ ISI:000253019600072,
Author = {Salluzzo, M. and Ghiringhelli, G. and Cezar, J. C. and Brookes, N. B.
   and De Luca, G. M. and Fracassi, F. and Vaglio, R.},
Title = {{Indirect electric field doping of the CuO(2) planes of the cuprate
   NdBa(2)Cu(3)O(7) superconductor}},
Journal = {{PHYSICAL REVIEW LETTERS}},
Year = {{2008}},
Volume = {{100}},
Number = {{5}},
Month = {{FEB 8}},
Abstract = {{The mechanism of field-effect doping in the 123 high critical
   temperature superconductors (HTS) has been investigated by x-ray
   absorption spectroscopy in the presence of an electric field. We
   demonstrate that holes are created at the CuO chains of the charge
   reservoir and that field-effect doping of the CuO(2) planes occurs by
   charge transfer, from the chains to the planes, of a fraction of the
   overall induced holes. The electronic properties of the charge reservoir
   and of the dielectric-HTS interface determine the electric field doping
   of the CuO(2) planes.}},
Publisher = {{AMER PHYSICAL SOC}},
Address = {{ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA}},
Type = {{Article}},
Language = {{English}},
Affiliation = {{Salluzzo, M (Corresponding Author), Univ Naples Federico 2, Dipartimento Sci Fis, CNR INFM COHERENTIA, Via Cinthia, I-80126 Naples, Italy.
   Salluzzo, M.; De Luca, G. M.; Vaglio, R., Univ Naples Federico 2, Dipartimento Sci Fis, CNR INFM COHERENTIA, I-80126 Naples, Italy.
   Ghiringhelli, G.; Fracassi, F., Politecn Milan, CNR INFM COHERENTIA, I-20133 Milan, Italy.
   Ghiringhelli, G.; Fracassi, F., Politecn Milan, Dipartimento Fis, I-20133 Milan, Italy.
   Cezar, J. C.; Brookes, N. B., European Synchrotron Radiat Facil, F-38043 Grenoble, France.}},
DOI = {{10.1103/PhysRevLett.100.056810}},
Article-Number = {{056810}},
ISSN = {{0031-9007}},
Keywords-Plus = {{THIN-FILMS; YBA2CU3O7-DELTA FILMS; SYSTEMS}},
Research-Areas = {{Physics}},
Web-of-Science-Categories  = {{Physics, Multidisciplinary}},
Author-Email = {{salluzzo@na.infn.it}},
ResearcherID-Numbers = {{Criginski Cezar, Julio/B-2731-2008
   Brookes, Nicholas B/C-6718-2019
   salluzzo, marco/C-5919-2009
   Cezar, Julio Criginski/D-5039-2012
   Ghiringhelli, Giacomo/D-1159-2014}},
ORCID-Numbers = {{Brookes, Nicholas B/0000-0002-1342-9530
   salluzzo, marco/0000-0001-8372-6963
   Cezar, Julio Criginski/0000-0002-7904-6874
   Ghiringhelli, Giacomo/0000-0003-0867-7748}},
Number-of-Cited-References = {{24}},
Times-Cited = {{34}},
Usage-Count-Last-180-days = {{0}},
Usage-Count-Since-2013 = {{22}},
Journal-ISO = {{Phys. Rev. Lett.}},
Doc-Delivery-Number = {{260OM}},
Unique-ID = {{ISI:000253019600072}},
DA = {{2020-12-22}},
}

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