The ADRESS project at the Swiss Light Source: A beamline for RIXS and ARPES studies on correlated and nanostructured materials

@article{ ISI:000246726300088,
Author = {Schmitt, T. and Strocov, V. N. and Raabel, J. and Schmidt, T. and
   Flechsii, U. and Dallera, C. and Ghiringhelli, G. and Imhof, A. and
   Jakob, B. and Vollenweider, C. and Schoenherr, V. and Chen, Q. and
   Betemps, R. and Krempaski, J. and Wang, X. and Braicovich, L. and
   Grioni, M. and Patthey, L.},
Title = {{The ADRESS project at the Swiss Light Source: A beamline for RIXS and
   ARPES studies on correlated and nanostructured materials}},
Journal = {{JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA}},
Year = {{2007}},
Volume = {{156}},
Pages = {{XLIX}},
Month = {{MAY}},
Note = {{10th International Conference on Electronic Spectroscopy and Structure,
   Foz do Iguacu, BRAZIL, AUG 28-SEP 01, 2006}},
Publisher = {{ELSEVIER SCIENCE BV}},
Address = {{PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS}},
Type = {{Meeting Abstract}},
Language = {{English}},
Affiliation = {{Paul Scherrer Inst, CH-5232 Villigen, Switzerland.
   Politecn Milan, I-20133 Milan, Italy.
   Ecole Polytech Fed Lausanne, CH-1015 Lausanne, Switzerland.}},
ISSN = {{0368-2048}},
Research-Areas = {{Spectroscopy}},
Web-of-Science-Categories  = {{Spectroscopy}},
ResearcherID-Numbers = {{Ghiringhelli, Giacomo/D-1159-2014
   Patthey, Luc/G-6130-2018
   Schmitt, Thorsten/A-7025-2010}},
ORCID-Numbers = {{Ghiringhelli, Giacomo/0000-0003-0867-7748
   Patthey, Luc/0000-0001-6101-8069
   }},
Number-of-Cited-References = {{0}},
Times-Cited = {{0}},
Usage-Count-Last-180-days = {{0}},
Usage-Count-Since-2013 = {{5}},
Journal-ISO = {{J. Electron Spectrosc. Relat. Phenom.}},
Doc-Delivery-Number = {{171HK}},
Unique-ID = {{ISI:000246726300088}},
DA = {{2020-12-22}},
}