SAXES, a high resolution spectrometer for resonant x-ray emission in the 400-1600 eV energy range

@article{ ISI:000242408600009,
Author = {Ghiringhelli, G. and Piazzalunga, A. and Dallera, C. and Trezzi, G. and
   Braicovich, L. and Schmitt, T. and Strocov, V. N. and Betemps, R. and
   Patthey, L. and Wang, X. and Grioni, M.},
Title = {{SAXES, a high resolution spectrometer for resonant x-ray emission in the
   400-1600 eV energy range}},
Journal = {{REVIEW OF SCIENTIFIC INSTRUMENTS}},
Year = {{2006}},
Volume = {{77}},
Number = {{11}},
Month = {{NOV}},
Abstract = {{We present a 5 m long spectrometer for soft x rays to be used at a
   synchrotron radiation beamline for resonant x-ray emission spectroscopy
   and resonant inelastic x-ray scattering in the 400-1600 eV energy range.
   It is based on a variable line spacing spherical grating (average groove
   density of 3200 mm(-1), R=58.55 m) and a charge coupled device two
   dimensional detector. With an x-ray spot on the sample of 10 mu m, the
   targeted resolving power is higher than 10 000 at all energies below
   1100 eV and better than 7000 at 1500 eV. The off-line tests made with Al
   and Mg K alpha(1,2) fluorescence emissions indicate that the
   spectrometer can actually work at 12 000 and 17 000 resolving power at
   the L-3 edges of Cu (930 eV) and of Ti (470 eV), respectively. SAXES
   (superadvanced x-ray emission spectrometer) is mounted on a rotating
   platform allowing to vary the scattering angle from 25 degrees to 130
   degrees. The spectrometer will be operational at the ADRESS (advanced
   resonant spectroscopies) beamline of the Swiss Light Source from 2007.}},
Publisher = {{AMER INST PHYSICS}},
Address = {{1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA}},
Type = {{Article}},
Language = {{English}},
Affiliation = {{Ghiringhelli, G (Corresponding Author), Politecn Milan, Dipartimento Fis, Piazza Leonardo Vinci 32, I-20133 Milan, Italy.
   Politecn Milan, Dipartimento Fis, I-20133 Milan, Italy.
   Paul Scherrer Inst, CH-5232 Villigen, Switzerland.
   Ecole Polytech Fed Lausanne, Inst Phys Nanostruct, CH-1015 Lausanne, Switzerland.}},
DOI = {{10.1063/1.2372731}},
Article-Number = {{113108}},
ISSN = {{0034-6748}},
EISSN = {{1089-7623}},
Keywords-Plus = {{SPECTROSCOPY; SCATTERING}},
Research-Areas = {{Instruments & Instrumentation; Physics}},
Web-of-Science-Categories  = {{Instruments & Instrumentation; Physics, Applied}},
ResearcherID-Numbers = {{Schmitt, Thorsten/A-7025-2010
   Ghiringhelli, Giacomo/D-1159-2014
   Patthey, Luc/G-6130-2018
   }},
ORCID-Numbers = {{Ghiringhelli, Giacomo/0000-0003-0867-7748
   Patthey, Luc/0000-0001-6101-8069
   Braicovich, Lucio/0000-0001-6548-9140}},
Number-of-Cited-References = {{22}},
Times-Cited = {{202}},
Usage-Count-Last-180-days = {{1}},
Usage-Count-Since-2013 = {{41}},
Journal-ISO = {{Rev. Sci. Instrum.}},
Doc-Delivery-Number = {{110VE}},
Unique-ID = {{ISI:000242408600009}},
OA = {{Green Published}},
DA = {{2020-12-22}},
}