by Yamasaki, A, Sekiyama, A, Imada, S, Tsunekawa, M, Dallera, C, Braicovich, L, Lee, TL, Ochiai, A and Suga, S
Abstract:
The bulk and surface electronic structures of Sm4As3 have been investigated by hard and soft X-ray photoemission spectroscopies (PESs). PES with a wide range of photon energies (hv’s) between 220 and 2450 eV demonstrates the absence of valence mixing in both high- and low-temperature phases, that is, the valence of Sm ions is definitely trivalent in the bulk and divalent on the surface. Atomic multiplet calculations taking into account the bulk and surface spectral weights at each hv well reproduce the experimental valence band PES and Sm 3d core-level spectra, supporting the valence difference between bulk and surface in Sm4As3.
Reference:
Photoemission Spectroscopy of Sm4As3 using soft and hard X-rays (Yamasaki, A, Sekiyama, A, Imada, S, Tsunekawa, M, Dallera, C, Braicovich, L, Lee, TL, Ochiai, A and Suga, S), In JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, PHYSICAL SOC JAPAN, volume 74, 2005.
Bibtex Entry:
@article{ ISI:000232192500030,
Author = {Yamasaki, A and Sekiyama, A and Imada, S and Tsunekawa, M and Dallera, C
   and Braicovich, L and Lee, TL and Ochiai, A and Suga, S},
Title = {{Photoemission Spectroscopy of Sm4As3 using soft and hard X-rays}},
Journal = {{JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN}},
Year = {{2005}},
Volume = {{74}},
Number = {{9}},
Pages = {{2538-2543}},
Month = {{SEP}},
Abstract = {{The bulk and surface electronic structures of Sm4As3 have been
   investigated by hard and soft X-ray photoemission spectroscopies (PESs).
   PES with a wide range of photon energies (hv's) between 220 and 2450 eV
   demonstrates the absence of valence mixing in both high- and
   low-temperature phases, that is, the valence of Sm ions is definitely
   trivalent in the bulk and divalent on the surface. Atomic multiplet
   calculations taking into account the bulk and surface spectral weights
   at each hv well reproduce the experimental valence band PES and Sm 3d
   core-level spectra, supporting the valence difference between bulk and
   surface in Sm4As3.}},
Publisher = {{PHYSICAL SOC JAPAN}},
Address = {{YUSHIMA URBAN BUILDING 5F, 2-31-22 YUSHIMA, BUNKYO-KU, TOKYO, 113-0034,
   JAPAN}},
Type = {{Article}},
Language = {{English}},
Affiliation = {{Yamasaki, A (Corresponding Author), Osaka Univ, Grad Sch Engn Sci, Toyonaka, Osaka 5608531, Japan.
   Osaka Univ, Grad Sch Engn Sci, Toyonaka, Osaka 5608531, Japan.
   Politecn Milan, Dipartimento Fis, INFM, I-20133 Milan, Italy.
   European Synchrotron Radiat Facil, F-38043 Grenoble, France.
   Tohoku Univ, Grad Sch Sci, Aoba Ku, Sendai, Miyagi 9808578, Japan.}},
DOI = {{10.1143/JPSJ.74.2538}},
ISSN = {{0031-9015}},
Keywords = {{hard X-ray; soft X-ray; photoemission spectroscopy; bulk sensitivity; Sm
   compounds}},
Keywords-Plus = {{RESOLUTION RESONANCE PHOTOEMISSION; INTERMEDIATE VALENCE; ELECTRONIC
   STATES; SAMARIUM METAL; MIXED-VALENCE; SURFACE; TRANSITION; ABSORPTION;
   SM; SYSTEMS}},
Research-Areas = {{Physics}},
Web-of-Science-Categories  = {{Physics, Multidisciplinary}},
Author-Email = {{yamasaki@decima.mp.es.osaka-u.ac.jp}},
ResearcherID-Numbers = {{Imada, Shin/F-1113-2014
   Sekiyama, Akira/G-1851-2016
   }},
ORCID-Numbers = {{Braicovich, Lucio/0000-0001-6548-9140}},
Number-of-Cited-References = {{33}},
Times-Cited = {{12}},
Usage-Count-Last-180-days = {{0}},
Usage-Count-Since-2013 = {{3}},
Journal-ISO = {{J. Phys. Soc. Jpn.}},
Doc-Delivery-Number = {{968WB}},
Unique-ID = {{ISI:000232192500030}},
DA = {{2020-12-22}},
}

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