Hard X-ray photoelectron spectroscopy: sensitivity to depth, chemistry and orbital character

@article{ ISI:000231075000012,
Author = {Dallera, C and Braicovich, L and Duo, L and Palenzona, A and Panaccione,
   G and Paolicelli, G and Cowie, BCC and Zegenhagen, J},
Title = {{Hard X-ray photoelectron spectroscopy: sensitivity to depth, chemistry
   and orbital character}},
Journal = {{NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION
   A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT}},
Year = {{2005}},
Volume = {{547}},
Number = {{1}},
Pages = {{113-123}},
Month = {{JUL 21}},
Note = {{Workshop on Hard X-Ray Photoelectron Spectroscopy, Grenoble, FRANCE, SEP
   11-12, 2003}},
Organization = {{ESRF; FOCUS GmbH; Gammadata Scienta; MB Sci AB; SPECS GmbH}},
Abstract = {{Photoelectron spectroscopy is growing in importance as a tool for
   characterizing not only the surface but also the bulk of solids. Photon
   fluxes of modern synchrotron radiation sources compensate the
   cross-section lowering of photoelectrons with kinetic energy in the hard
   X-ray range, the only electrons able to escape from bulk regions. We
   present examples of photoelectron emission experiments where we measured
   core and valence photoelectrons up to similar to 5 keV kinetic energy.
   We studied the evolution of photoelectron emission spectra collected at
   increasing incident photon energy: core-level spectra of Samarium and
   its compounds indicate increased bulk-sensitivity, valence band spectra
   reveal significant cross-section changes of electrons with different
   orbital character. The chemical and depth sensitivity given by the
   energy dependence of the attenuation length has been quantitatively
   assessed in the case of layered GaAs/AlAs/GaAs. These are examples of
   the wide scientific importance that hard X-ray photoelectron
   spectroscopy is acquiring in many aspects of the study of solids. (c)
   2005 Elsevier B.V. All rights reserved.}},
Publisher = {{ELSEVIER}},
Address = {{RADARWEG 29, 1043 NX AMSTERDAM, NETHERLANDS}},
Type = {{Article; Proceedings Paper}},
Language = {{English}},
Affiliation = {{Dallera, C (Corresponding Author), Politecn Milan, Dipartimento Fis, INFM, Piazza L Vinci 32, I-20133 Milan, Italy.
   Politecn Milan, Dipartimento Fis, INFM, I-20133 Milan, Italy.
   Univ Genoa, INFM, Dipartimento Chim & Chim Ind, I-16146 Genoa, Italy.
   INFM, Lab TASC, I-34012 Trieste, Italy.
   Univ Roma 3, INFM, I-00146 Rome, Italy.
   European Synchrotron Radiat Facil, F-38043 Grenoble, France.}},
DOI = {{10.1016/j.nima.2005.05.017}},
ISSN = {{0168-9002}},
EISSN = {{1872-9576}},
Keywords = {{photoelectron spectroscopy; hard X-rays; attenuation length;
   cross-sections}},
Keywords-Plus = {{ELECTRONIC-STRUCTURE; ESCAPE DEPTH; PHOTOEMISSION; SURFACE; CE;
   TRANSITION; VALENCE; SPECTRA; SYSTEMS}},
Research-Areas = {{Instruments & Instrumentation; Nuclear Science & Technology; Physics}},
Web-of-Science-Categories  = {{Instruments & Instrumentation; Nuclear Science & Technology; Physics,
   Nuclear; Physics, Particles & Fields}},
Author-Email = {{claudia.dallera@fisi.polimi.it}},
ResearcherID-Numbers = {{Duo, Lamberto/N-9311-2014
   Paolicelli, Guido/B-7732-2015
   }},
ORCID-Numbers = {{Paolicelli, Guido/0000-0002-9431-2309
   Braicovich, Lucio/0000-0001-6548-9140}},
Number-of-Cited-References = {{40}},
Times-Cited = {{10}},
Usage-Count-Last-180-days = {{0}},
Usage-Count-Since-2013 = {{4}},
Journal-ISO = {{Nucl. Instrum. Methods Phys. Res. Sect. A-Accel. Spectrom. Dect. Assoc.
   Equip.}},
Doc-Delivery-Number = {{953KK}},
Unique-ID = {{ISI:000231075000012}},
DA = {{2020-12-22}},
}