by Dallera, C, Duo, L, Braicovich, L, Panaccione, G and Paolicelli, G, Cowie, B and Zegenhagen, J
Abstract:
We present hard x-ray photoemission measurements from GaAs samples with a 10-Angstrom-thick layer of AlAs buried at different depths. The intensity trend versus kinetic energy of the Al 1s signal allows extraction of the x-ray attenuation length, which we find to reach similar to100 Angstrom at a kinetic energy of 6 keV. On one sample exposed to air for several days we obtain qualitative information on the oxidation at different depth scales by exploiting the energy dependence of the attenuation length. This suggests the strong potential of hard x-ray photoemission in the nondestructive characterization of diluted materials on a depth scale interesting to modern nanotechnologies. (C) 2004 American Institute of Physics.
Reference:
Looking 100 A deep into spatially inhomogeneous dilute systems with hard x-ray photoemission (Dallera, C, Duo, L, Braicovich, L, Panaccione, G and Paolicelli, G, Cowie, B and Zegenhagen, J), In APPLIED PHYSICS LETTERS, AMER INST PHYSICS, volume 85, 2004.
Bibtex Entry:
@article{ ISI:000224962800089, Author = {Dallera, C and Duo, L and Braicovich, L and Panaccione, G and Paolicelli, G and Cowie, B and Zegenhagen, J}, Title = {{Looking 100 A deep into spatially inhomogeneous dilute systems with hard x-ray photoemission}}, Journal = {{APPLIED PHYSICS LETTERS}}, Year = {{2004}}, Volume = {{85}}, Number = {{19}}, Pages = {{4532-4534}}, Month = {{NOV 8}}, Abstract = {{We present hard x-ray photoemission measurements from GaAs samples with a 10-Angstrom-thick layer of AlAs buried at different depths. The intensity trend versus kinetic energy of the Al 1s signal allows extraction of the x-ray attenuation length, which we find to reach similar to100 Angstrom at a kinetic energy of 6 keV. On one sample exposed to air for several days we obtain qualitative information on the oxidation at different depth scales by exploiting the energy dependence of the attenuation length. This suggests the strong potential of hard x-ray photoemission in the nondestructive characterization of diluted materials on a depth scale interesting to modern nanotechnologies. (C) 2004 American Institute of Physics.}}, Publisher = {{AMER INST PHYSICS}}, Address = {{1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA}}, Type = {{Article}}, Language = {{English}}, Affiliation = {{Dallera, C (Corresponding Author), Politecn Milan, INFM, Dipartimento Fis, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy. Politecn Milan, INFM, Dipartimento Fis, I-20133 Milan, Italy. Lab TASC INFM, I-34012 Trieste, Italy. Univ Roma III, INFM, I-00146 Rome, Italy. European Synchrotron Radiat Facil, F-38043 Grenoble, France.}}, DOI = {{10.1063/1.1814441}}, ISSN = {{0003-6951}}, EISSN = {{1077-3118}}, Keywords-Plus = {{MEAN ESCAPE DEPTH; SIGNAL PHOTOELECTRONS; SOLIDS}}, Research-Areas = {{Physics}}, Web-of-Science-Categories = {{Physics, Applied}}, Author-Email = {{claudia.dallera@fisi.polimi.it}}, ResearcherID-Numbers = {{Paolicelli, Guido/B-7732-2015 Duo, Lamberto/N-9311-2014 }}, ORCID-Numbers = {{Paolicelli, Guido/0000-0002-9431-2309 Braicovich, Lucio/0000-0001-6548-9140}}, Number-of-Cited-References = {{15}}, Times-Cited = {{64}}, Usage-Count-Last-180-days = {{0}}, Usage-Count-Since-2013 = {{5}}, Journal-ISO = {{Appl. Phys. Lett.}}, Doc-Delivery-Number = {{869DE}}, Unique-ID = {{ISI:000224962800089}}, DA = {{2020-12-22}}, }
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