by Dallera, C, Annese, E, Rueff, JP, Palenzona, A, Vanko, G and Braicovich, L, Shukla, A and Grioni, M
Abstract:
We used X-ray absorption in the partial fluorescence yield mode (PFY-XAS), and resonant X-ray emission (RXES) to study the pressure dependence of Yb valence in the intermediate valence compound YbAl2. We find that the Yb valence changes from 2.25 at ambient pressure to 2.95 at 385 kbar, and that the valence transition is completed around 200 kbar. The combined use of complementary spectroscopic techniques considerably reduces the uncertainties in the extracted valence values. (C) 2004 Elsevier B.V. All rights reserved.
Reference:
Valence changes in YbAl2 under pressure: a resonant inelastic X-ray emission study (Dallera, C, Annese, E, Rueff, JP, Palenzona, A, Vanko, G and Braicovich, L, Shukla, A and Grioni, M), In JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, ELSEVIER SCIENCE BV, volume 137, 2004.
Bibtex Entry:
@article{ ISI:000222251900106,
Author = {Dallera, C and Annese, E and Rueff, JP and Palenzona, A and Vanko, G and
   Braicovich, L and Shukla, A and Grioni, M},
Title = {{Valence changes in YbAl2 under pressure: a resonant inelastic X-ray
   emission study}},
Journal = {{JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA}},
Year = {{2004}},
Volume = {{137}},
Number = {{SI}},
Pages = {{651-655}},
Month = {{JUL}},
Note = {{9th International Conference on Electronic Spectroscopy and Structure,
   Uppsala, SWEDEN, JUN 30-JUL 04, 2003}},
Abstract = {{We used X-ray absorption in the partial fluorescence yield mode
   (PFY-XAS), and resonant X-ray emission (RXES) to study the pressure
   dependence of Yb valence in the intermediate valence compound YbAl2. We
   find that the Yb valence changes from 2.25 at ambient pressure to 2.95
   at 385 kbar, and that the valence transition is completed around 200
   kbar. The combined use of complementary spectroscopic techniques
   considerably reduces the uncertainties in the extracted valence values.
   (C) 2004 Elsevier B.V. All rights reserved.}},
Publisher = {{ELSEVIER SCIENCE BV}},
Address = {{PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS}},
Type = {{Article; Proceedings Paper}},
Language = {{English}},
Affiliation = {{Dallera, C (Corresponding Author), Politecn Milan, INFM, Dipartimento Fis, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy.
   Politecn Milan, INFM, Dipartimento Fis, I-20133 Milan, Italy.
   Univ Modena, INFM, Dipartimento Fis, I-41100 Modena, Italy.
   Univ Paris 06, UMR 7614, Lab Chim Phys Mat & Rayonnement, F-75231 Paris, France.
   Univ Genoa, Dipartimento Chim & Chim Ind, I-16146 Genoa, Italy.
   European Synchrotron Radiat Facil, F-38043 Grenoble, France.
   Ecole Polytech Fed Lausanne, IPN, CH-1015 Lausanne, Switzerland.
   Lab Minist Cristallog, F-75252 Paris 05, France.}},
DOI = {{10.1016/j.elspec.2004.02.100}},
ISSN = {{0368-2048}},
Keywords = {{resonant inelastic X-ray scattering; X-ray absorption; YbAl2; mixed
   valence}},
Keywords-Plus = {{CE COMPOUNDS; ABSORPTION; EXPANSION; SUSCEPTIBILITY; SPECTROSCOPIES;
   DEPENDENCE; SPECTRA; SYSTEMS; LEVEL}},
Research-Areas = {{Spectroscopy}},
Web-of-Science-Categories  = {{Spectroscopy}},
Author-Email = {{claudia.dallera@fisi.polimi.it}},
ResearcherID-Numbers = {{Rueff, Jean-Pascal/D-8938-2016
   Vanko, Gyorgy/B-8176-2012
   Annese, Emilia/AAM-3070-2020
   Shukla, Abhay/G-6753-2011
   }},
ORCID-Numbers = {{Rueff, Jean-Pascal/0000-0003-3594-918X
   Vanko, Gyorgy/0000-0002-3095-6551
   Annese, Emilia/0000-0002-4066-697X
   Braicovich, Lucio/0000-0001-6548-9140}},
Number-of-Cited-References = {{22}},
Times-Cited = {{7}},
Usage-Count-Last-180-days = {{0}},
Usage-Count-Since-2013 = {{8}},
Journal-ISO = {{J. Electron Spectrosc. Relat. Phenom.}},
Doc-Delivery-Number = {{832FF}},
Unique-ID = {{ISI:000222251900106}},
DA = {{2020-12-22}},
}

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