by Devereaux, T. P., Shvaika, A. M., Wu, K., Wohlfeld, K., Jia, C. J., Wang, Y., Moritz, B., Chaix, L., Lee, W. -S. and Shen, Z. -X., Ghiringhelli, G. and Braicovich, L.
Abstract:
The coupling between lattice and charge degrees of freedom in condensed matter materials is ubiquitous and can often result in interesting properties and ordered phases, including conventional superconductivity, charge-density wave order, and metal-insulator transitions. Angle-resolved photoemission spectroscopy and both neutron and nonresonant x-ray scattering serve as effective probes for determining the behavior of appropriate, individual degrees of freedom-the electronic structure and lattice excitation, or phonon dispersion, respectively. However, each provides less direct information about the mutual coupling between the degrees of freedom, usually through self-energy effects, which tend to renormalize and broaden spectral features precisely where the coupling is strong, impacting one’s ability to quantitatively characterize the coupling. Here, we demonstrate that resonant inelastic x-ray scattering, or RIXS, can be an effective tool to directly determine the relative strength and momentum dependence of the electron-phonon coupling in condensed matter systems. Using a diagrammatic approach for an eight-band model of copper oxides, we study the contributions from the lowest-order diagrams to the full RIXS intensity for a realistic scattering geometry, accounting for matrix element effects in the scattering cross section, as well as the momentum dependence of the electron-phonon coupling vertex. A detailed examination of these maps offers a unique perspective into the characteristics of electron-phonon coupling, which complements both neutron and nonresonant x-ray scattering, as well as Raman and infrared conductivity.
Reference:
Directly Characterizing the Relative Strength and Momentum Dependence of Electron-Phonon Coupling Using Resonant Inelastic X-Ray Scattering (Devereaux, T. P., Shvaika, A. M., Wu, K., Wohlfeld, K., Jia, C. J., Wang, Y., Moritz, B., Chaix, L., Lee, W. -S. and Shen, Z. -X., Ghiringhelli, G. and Braicovich, L.), In PHYSICAL REVIEW X, AMER PHYSICAL SOC, volume 6, 2016.
Bibtex Entry:
@article{ ISI:000390219700002, Author = {Devereaux, T. P. and Shvaika, A. M. and Wu, K. and Wohlfeld, K. and Jia, C. J. and Wang, Y. and Moritz, B. and Chaix, L. and Lee, W. -S. and Shen, Z. -X. and Ghiringhelli, G. and Braicovich, L.}, Title = {{Directly Characterizing the Relative Strength and Momentum Dependence of Electron-Phonon Coupling Using Resonant Inelastic X-Ray Scattering}}, Journal = {{PHYSICAL REVIEW X}}, Year = {{2016}}, Volume = {{6}}, Number = {{4}}, Month = {{OCT 25}}, Abstract = {{The coupling between lattice and charge degrees of freedom in condensed matter materials is ubiquitous and can often result in interesting properties and ordered phases, including conventional superconductivity, charge-density wave order, and metal-insulator transitions. Angle-resolved photoemission spectroscopy and both neutron and nonresonant x-ray scattering serve as effective probes for determining the behavior of appropriate, individual degrees of freedom-the electronic structure and lattice excitation, or phonon dispersion, respectively. However, each provides less direct information about the mutual coupling between the degrees of freedom, usually through self-energy effects, which tend to renormalize and broaden spectral features precisely where the coupling is strong, impacting one's ability to quantitatively characterize the coupling. Here, we demonstrate that resonant inelastic x-ray scattering, or RIXS, can be an effective tool to directly determine the relative strength and momentum dependence of the electron-phonon coupling in condensed matter systems. Using a diagrammatic approach for an eight-band model of copper oxides, we study the contributions from the lowest-order diagrams to the full RIXS intensity for a realistic scattering geometry, accounting for matrix element effects in the scattering cross section, as well as the momentum dependence of the electron-phonon coupling vertex. A detailed examination of these maps offers a unique perspective into the characteristics of electron-phonon coupling, which complements both neutron and nonresonant x-ray scattering, as well as Raman and infrared conductivity.}}, Publisher = {{AMER PHYSICAL SOC}}, Address = {{ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA}}, Type = {{Article}}, Language = {{English}}, Affiliation = {{Devereaux, TP (Corresponding Author), SLAC Natl Accelerator Lab, Stanford Inst Mat & Energy Sci, 2575 Sand Hill Rd, Menlo Pk, CA 94025 USA. Devereaux, TP (Corresponding Author), Stanford Univ, Geballe Lab Adv Mat, Stanford, CA 94305 USA. Devereaux, T. P.; Wu, K.; Jia, C. J.; Wang, Y.; Moritz, B.; Chaix, L.; Lee, W. -S.; Shen, Z. -X., SLAC Natl Accelerator Lab, Stanford Inst Mat & Energy Sci, 2575 Sand Hill Rd, Menlo Pk, CA 94025 USA. Devereaux, T. P.; Shen, Z. -X., Stanford Univ, Geballe Lab Adv Mat, Stanford, CA 94305 USA. Shvaika, A. M., Natl Acad Sci Ukraine, Inst Condensed Matter Phys, UA-79011 Lvov, Ukraine. Wohlfeld, K., Univ Warsaw, Inst Theoret Phys, Fac Phys, Pasteura 5, PL-02093 Warsaw, Poland. Shen, Z. -X., Stanford Univ, Dept Phys & Appl Phys, Stanford, CA 94305 USA. Ghiringhelli, G.; Braicovich, L., Politecn Milan, CNR SPIN, I-20133 Milan, Italy. Ghiringhelli, G.; Braicovich, L., Politecn Milan, Dipartimento Fis, I-20133 Milan, Italy.}}, DOI = {{10.1103/PhysRevX.6.041019}}, Article-Number = {{041019}}, ISSN = {{2160-3308}}, Keywords-Plus = {{RAMAN-SCATTERING; T-C; HIGH-T(C) SUPERCONDUCTORS; SPIN EXCITATIONS; METAL; ENERGY; ORIGIN; PROBE}}, Research-Areas = {{Physics}}, Web-of-Science-Categories = {{Physics, Multidisciplinary}}, ResearcherID-Numbers = {{Moritz, Brian J/D-7505-2015 Shvaika, Andrij/G-8704-2011 Wohlfeld, Krzysztof/Q-2351-2019 Ghiringhelli, Giacomo/D-1159-2014 Wang, Yao/L-8653-2018 Wohlfeld, Krzysztof/B-4489-2014 }}, ORCID-Numbers = {{Moritz, Brian J/0000-0002-3747-8484 Shvaika, Andrij/0000-0002-5113-8259 Wohlfeld, Krzysztof/0000-0002-6524-8264 Ghiringhelli, Giacomo/0000-0003-0867-7748 Wang, Yao/0000-0003-1736-0187 Wohlfeld, Krzysztof/0000-0002-6524-8264 Chaix, Laura/0000-0002-6757-9040 Braicovich, Lucio/0000-0001-6548-9140}}, Funding-Acknowledgement = {{U.S. Department of Energy (DOE), Office of Basic Energy Sciences, Division of Materials Sciences and EngineeringUnited States Department of Energy (DOE) {[}DE-AC02-76SF00515]; SLAC National Accelerator Laboratory (SLAC); Stanford Institute for Materials and Energy Sciences; Polish National Science Center (NCN) {[}2012/04/A/ST3/00331]}}, Funding-Text = {{This research was supported by the U.S. Department of Energy (DOE), Office of Basic Energy Sciences, Division of Materials Sciences and Engineering, under Contract No. DE-AC02-76SF00515, as well as by the SLAC National Accelerator Laboratory (SLAC), Stanford Institute for Materials and Energy Sciences. K. W. acknowledges support from the Polish National Science Center (NCN) under Project No. 2012/04/A/ST3/00331.}}, Number-of-Cited-References = {{50}}, Times-Cited = {{33}}, Usage-Count-Last-180-days = {{1}}, Usage-Count-Since-2013 = {{34}}, Journal-ISO = {{Phys. Rev. X}}, Doc-Delivery-Number = {{EF3JD}}, Unique-ID = {{ISI:000390219700002}}, OA = {{DOAJ Gold}}, DA = {{2020-12-22}}, }
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