by Devereaux, T. P., Shvaika, A. M., Wu, K., Wohlfeld, K., Jia, C. J., Wang, Y., Moritz, B., Chaix, L., Lee, W. -S. and Shen, Z. -X., Ghiringhelli, G. and Braicovich, L.
Abstract:
The coupling between lattice and charge degrees of freedom in condensed matter materials is ubiquitous and can often result in interesting properties and ordered phases, including conventional superconductivity, charge-density wave order, and metal-insulator transitions. Angle-resolved photoemission spectroscopy and both neutron and nonresonant x-ray scattering serve as effective probes for determining the behavior of appropriate, individual degrees of freedom-the electronic structure and lattice excitation, or phonon dispersion, respectively. However, each provides less direct information about the mutual coupling between the degrees of freedom, usually through self-energy effects, which tend to renormalize and broaden spectral features precisely where the coupling is strong, impacting one’s ability to quantitatively characterize the coupling. Here, we demonstrate that resonant inelastic x-ray scattering, or RIXS, can be an effective tool to directly determine the relative strength and momentum dependence of the electron-phonon coupling in condensed matter systems. Using a diagrammatic approach for an eight-band model of copper oxides, we study the contributions from the lowest-order diagrams to the full RIXS intensity for a realistic scattering geometry, accounting for matrix element effects in the scattering cross section, as well as the momentum dependence of the electron-phonon coupling vertex. A detailed examination of these maps offers a unique perspective into the characteristics of electron-phonon coupling, which complements both neutron and nonresonant x-ray scattering, as well as Raman and infrared conductivity.
Reference:
Directly Characterizing the Relative Strength and Momentum Dependence of Electron-Phonon Coupling Using Resonant Inelastic X-Ray Scattering (Devereaux, T. P., Shvaika, A. M., Wu, K., Wohlfeld, K., Jia, C. J., Wang, Y., Moritz, B., Chaix, L., Lee, W. -S. and Shen, Z. -X., Ghiringhelli, G. and Braicovich, L.), In PHYSICAL REVIEW X, AMER PHYSICAL SOC, volume 6, 2016.
Bibtex Entry:
@article{ ISI:000390219700002,
Author = {Devereaux, T. P. and Shvaika, A. M. and Wu, K. and Wohlfeld, K. and Jia,
   C. J. and Wang, Y. and Moritz, B. and Chaix, L. and Lee, W. -S. and
   Shen, Z. -X. and Ghiringhelli, G. and Braicovich, L.},
Title = {{Directly Characterizing the Relative Strength and Momentum Dependence of
   Electron-Phonon Coupling Using Resonant Inelastic X-Ray Scattering}},
Journal = {{PHYSICAL REVIEW X}},
Year = {{2016}},
Volume = {{6}},
Number = {{4}},
Month = {{OCT 25}},
Abstract = {{The coupling between lattice and charge degrees of freedom in condensed
   matter materials is ubiquitous and can often result in interesting
   properties and ordered phases, including conventional superconductivity,
   charge-density wave order, and metal-insulator transitions.
   Angle-resolved photoemission spectroscopy and both neutron and
   nonresonant x-ray scattering serve as effective probes for determining
   the behavior of appropriate, individual degrees of freedom-the
   electronic structure and lattice excitation, or phonon dispersion,
   respectively. However, each provides less direct information about the
   mutual coupling between the degrees of freedom, usually through
   self-energy effects, which tend to renormalize and broaden spectral
   features precisely where the coupling is strong, impacting one's ability
   to quantitatively characterize the coupling. Here, we demonstrate that
   resonant inelastic x-ray scattering, or RIXS, can be an effective tool
   to directly determine the relative strength and momentum dependence of
   the electron-phonon coupling in condensed matter systems. Using a
   diagrammatic approach for an eight-band model of copper oxides, we study
   the contributions from the lowest-order diagrams to the full RIXS
   intensity for a realistic scattering geometry, accounting for matrix
   element effects in the scattering cross section, as well as the momentum
   dependence of the electron-phonon coupling vertex. A detailed
   examination of these maps offers a unique perspective into the
   characteristics of electron-phonon coupling, which complements both
   neutron and nonresonant x-ray scattering, as well as Raman and infrared
   conductivity.}},
Publisher = {{AMER PHYSICAL SOC}},
Address = {{ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA}},
Type = {{Article}},
Language = {{English}},
Affiliation = {{Devereaux, TP (Corresponding Author), SLAC Natl Accelerator Lab, Stanford Inst Mat & Energy Sci, 2575 Sand Hill Rd, Menlo Pk, CA 94025 USA.
   Devereaux, TP (Corresponding Author), Stanford Univ, Geballe Lab Adv Mat, Stanford, CA 94305 USA.
   Devereaux, T. P.; Wu, K.; Jia, C. J.; Wang, Y.; Moritz, B.; Chaix, L.; Lee, W. -S.; Shen, Z. -X., SLAC Natl Accelerator Lab, Stanford Inst Mat & Energy Sci, 2575 Sand Hill Rd, Menlo Pk, CA 94025 USA.
   Devereaux, T. P.; Shen, Z. -X., Stanford Univ, Geballe Lab Adv Mat, Stanford, CA 94305 USA.
   Shvaika, A. M., Natl Acad Sci Ukraine, Inst Condensed Matter Phys, UA-79011 Lvov, Ukraine.
   Wohlfeld, K., Univ Warsaw, Inst Theoret Phys, Fac Phys, Pasteura 5, PL-02093 Warsaw, Poland.
   Shen, Z. -X., Stanford Univ, Dept Phys & Appl Phys, Stanford, CA 94305 USA.
   Ghiringhelli, G.; Braicovich, L., Politecn Milan, CNR SPIN, I-20133 Milan, Italy.
   Ghiringhelli, G.; Braicovich, L., Politecn Milan, Dipartimento Fis, I-20133 Milan, Italy.}},
DOI = {{10.1103/PhysRevX.6.041019}},
Article-Number = {{041019}},
ISSN = {{2160-3308}},
Keywords-Plus = {{RAMAN-SCATTERING; T-C; HIGH-T(C) SUPERCONDUCTORS; SPIN EXCITATIONS;
   METAL; ENERGY; ORIGIN; PROBE}},
Research-Areas = {{Physics}},
Web-of-Science-Categories  = {{Physics, Multidisciplinary}},
ResearcherID-Numbers = {{Moritz, Brian J/D-7505-2015
   Shvaika, Andrij/G-8704-2011
   Wohlfeld, Krzysztof/Q-2351-2019
   Ghiringhelli, Giacomo/D-1159-2014
   Wang, Yao/L-8653-2018
   Wohlfeld, Krzysztof/B-4489-2014
   }},
ORCID-Numbers = {{Moritz, Brian J/0000-0002-3747-8484
   Shvaika, Andrij/0000-0002-5113-8259
   Wohlfeld, Krzysztof/0000-0002-6524-8264
   Ghiringhelli, Giacomo/0000-0003-0867-7748
   Wang, Yao/0000-0003-1736-0187
   Wohlfeld, Krzysztof/0000-0002-6524-8264
   Chaix, Laura/0000-0002-6757-9040
   Braicovich, Lucio/0000-0001-6548-9140}},
Funding-Acknowledgement = {{U.S. Department of Energy (DOE), Office of Basic Energy Sciences,
   Division of Materials Sciences and EngineeringUnited States Department
   of Energy (DOE) {[}DE-AC02-76SF00515]; SLAC National Accelerator
   Laboratory (SLAC); Stanford Institute for Materials and Energy Sciences;
   Polish National Science Center (NCN) {[}2012/04/A/ST3/00331]}},
Funding-Text = {{This research was supported by the U.S. Department of Energy (DOE),
   Office of Basic Energy Sciences, Division of Materials Sciences and
   Engineering, under Contract No. DE-AC02-76SF00515, as well as by the
   SLAC National Accelerator Laboratory (SLAC), Stanford Institute for
   Materials and Energy Sciences. K. W. acknowledges support from the
   Polish National Science Center (NCN) under Project No.
   2012/04/A/ST3/00331.}},
Number-of-Cited-References = {{50}},
Times-Cited = {{33}},
Usage-Count-Last-180-days = {{1}},
Usage-Count-Since-2013 = {{34}},
Journal-ISO = {{Phys. Rev. X}},
Doc-Delivery-Number = {{EF3JD}},
Unique-ID = {{ISI:000390219700002}},
OA = {{DOAJ Gold}},
DA = {{2020-12-22}},
}

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