A time-of-flight-Mott apparatus for soft x-ray spin resolved photoemission on solid samples

@article{ ISI:000254538100035,
Author = {Moreschini, L. and Ghiringhelli, G. and Larsson, K. and Veit, U. and
   Brookes, N. B.},
Title = {{A time-of-flight-Mott apparatus for soft x-ray spin resolved
   photoemission on solid samples}},
Journal = {{REVIEW OF SCIENTIFIC INSTRUMENTS}},
Year = {{2008}},
Volume = {{79}},
Number = {{3}},
Month = {{MAR}},
Abstract = {{We describe a new spectrometer for spin resolved photoemission from
   solids in the soft x-ray energy range. It is mounted on the ID08
   beamline at the ESRF light source and consists of a time-of-flight (TOF)
   energy analyzer coupled to a retarding mini-Mott spin polarimeter. It
   represents a valid alternative to the spin detection system already
   available on ID08, especially for the acquisition of wide energy
   regions, where the TOF technique is extremely efficient. By testing the
   new spectrometer on the 4f levels of Au and on CuO at the Cu L-3
   threshold we show that the effective Sherman function and figure of
   merit achieved are, respectively, S-eff similar or equal to 0.16 and eta
   similar or equal to 1.3 x 10(-4) and that for certain experiments we
   obtain a significant gain in intensity with respect to the previous
   system. (C) 2008 American Institute of Physics.}},
Publisher = {{AMER INST PHYSICS}},
Address = {{1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA}},
Type = {{Article}},
Language = {{English}},
Affiliation = {{Moreschini, L (Corresponding Author), Ecole Polytech Fed Lausanne, Inst Phys Nanostruct, CH-1015 Lausanne, Switzerland.
   Moreschini, L.; Larsson, K.; Veit, U.; Brookes, N. B., European Synchrotron Radiat Facil, Grenoble, F-38043 Grenoble, France.
   Ghiringhelli, G., Politecn Milan, Dipartimento Fis, CNR, INFM Coherentia, I-20133 Milan, Italy.}},
DOI = {{10.1063/1.2868781}},
Article-Number = {{033905}},
ISSN = {{0034-6748}},
EISSN = {{1089-7623}},
Keywords-Plus = {{PHOTOELECTRON-SPECTROSCOPY; AUGER ELECTRONS; THIN-FILMS; POLARIZATION;
   SCATTERING; ORIENTATION; RADIATION; ANALYZER; NUCLEI}},
Research-Areas = {{Instruments & Instrumentation; Physics}},
Web-of-Science-Categories  = {{Instruments & Instrumentation; Physics, Applied}},
ResearcherID-Numbers = {{Ghiringhelli, Giacomo/D-1159-2014
   Brookes, Nicholas B/C-6718-2019
   }},
ORCID-Numbers = {{Ghiringhelli, Giacomo/0000-0003-0867-7748
   Brookes, Nicholas B/0000-0002-1342-9530
   moreschini, luca/0000-0001-8226-084X}},
Number-of-Cited-References = {{42}},
Times-Cited = {{7}},
Usage-Count-Last-180-days = {{0}},
Usage-Count-Since-2013 = {{10}},
Journal-ISO = {{Rev. Sci. Instrum.}},
Doc-Delivery-Number = {{281ZT}},
Unique-ID = {{ISI:000254538100035}},
DA = {{2020-12-22}},
}