Spectroscopy of strongly correlated systems: Resonant x-ray scattering without energy resolution in the scattered beam

@article{ ISI:000244533400004,
Author = {Braicovich, L. and Tagliaferri, A. and Annese, E. and Ghiringhelli, G.
   and Dallera, C. and Fracassi, F. and Palenzona, A. and Brookes, N. B.},
Title = {{Spectroscopy of strongly correlated systems: Resonant x-ray scattering
   without energy resolution in the scattered beam}},
Journal = {{PHYSICAL REVIEW B}},
Year = {{2007}},
Volume = {{75}},
Number = {{7}},
Month = {{FEB}},
Abstract = {{The total emission of photons excited by x rays (90 degrees between
   incident and detected photons) is measured vs the incident photon energy
   at the Ce M-4,M-5 edges in CeIn3, CeSnIn2, CeAl2, CePd3, and CeRh2, and
   at the Ni L-2,L-3 edges in NiO. The results show the signature of a
   second-order process; these experiments must be interpreted as genuine
   resonant inelastic scattering (though without energy resolution of the
   emitted photons) and not as absorption spectroscopy measured by the
   total fluorescence yield. In Ce compounds, information on bulk
   hybridization can thus be obtained simply and with high sensitivity. The
   branching ratio between the different scattering channels is also
   measured. This approach opens innovative perspectives in resonant
   inelastic x-ray scattering.}},
Publisher = {{AMER PHYSICAL SOC}},
Address = {{ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA}},
Type = {{Article}},
Language = {{English}},
Affiliation = {{Braicovich, L (Corresponding Author), Politecn Milan, Dipartimento Fis, CNR, INFM,SOFT, P Leonardo da Vinci 32, I-20133 Milan, Italy.
   Politecn Milan, Dipartimento Fis, CNR, INFM,SOFT, I-20133 Milan, Italy.
   CNR, INFM, TASC, I-34012 Trieste, Italy.
   Politecn Milan, Dipartimento Fis, CNR, INFM,COHERENTIA, I-20133 Milan, Italy.
   Univ Genoa, Dipartimento Chim & Chim Ind, CNR, INFM, I-16146 Genoa, Italy.
   European Synchrotron Radiat Facil, F-38043 Grenoble, France.}},
DOI = {{10.1103/PhysRevB.75.073104}},
Article-Number = {{073104}},
ISSN = {{2469-9950}},
EISSN = {{2469-9969}},
Keywords-Plus = {{ELECTRONIC-STRUCTURE; RAMAN-SCATTERING; DEPENDENCE; NIO}},
Research-Areas = {{Materials Science; Physics}},
Web-of-Science-Categories  = {{Materials Science, Multidisciplinary; Physics, Applied; Physics,
   Condensed Matter}},
ResearcherID-Numbers = {{Annese, Emilia/AAM-3070-2020
   Brookes, Nicholas B/C-6718-2019
   Ghiringhelli, Giacomo/D-1159-2014
   Tagliaferri, Alberto/L-2903-2015
   }},
ORCID-Numbers = {{Brookes, Nicholas B/0000-0002-1342-9530
   Ghiringhelli, Giacomo/0000-0003-0867-7748
   Tagliaferri, Alberto/0000-0001-8001-1786
   Braicovich, Lucio/0000-0001-6548-9140
   Annese, Emilia/0000-0002-4066-697X}},
Number-of-Cited-References = {{18}},
Times-Cited = {{5}},
Usage-Count-Last-180-days = {{0}},
Usage-Count-Since-2013 = {{11}},
Journal-ISO = {{Phys. Rev. B}},
Doc-Delivery-Number = {{140UY}},
Unique-ID = {{ISI:000244533400004}},
DA = {{2020-12-22}},
}