by Yamasaki, A, Sekiyama, A, Tsunekawa, M, Imada, S, Ochiai, A, Dallera, C, Braicovich, L, Lee, TL and Suga, S
Abstract:
We have investigated the bulk and surface electronic structures of Sm4As3 by using hard and soft X-ray photoemission spectroscopies (PESs). The valence band spectral shape changes much with photon energies (hvs) due to the variation of both photoionization cross sections and bulk sensitivity. PES with the wide range of hvs between 220 and 2450eV demonstrates that the valence of the Sm ions is definitely trivalent in the bulk and divalent at the surface. (c) 2004 Elsevier B.V. All rights reserved.
Reference:
Hard and soft X-ray photoemission spectroscopies of ferromagnetic Sm4As3 (Yamasaki, A, Sekiyama, A, Tsunekawa, M, Imada, S, Ochiai, A, Dallera, C, Braicovich, L, Lee, TL and Suga, S), In JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, ELSEVIER SCIENCE BV, volume 144, 2005.
Bibtex Entry:
@article{ ISI:000229657100148,
Author = {Yamasaki, A and Sekiyama, A and Tsunekawa, M and Imada, S and Ochiai, A
   and Dallera, C and Braicovich, L and Lee, TL and Suga, S},
Title = {{Hard and soft X-ray photoemission spectroscopies of ferromagnetic Sm4As3}},
Journal = {{JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA}},
Year = {{2005}},
Volume = {{144}},
Number = {{SI}},
Pages = {{617-619}},
Month = {{JUN}},
Note = {{14th International Conference on Vacuum Ultraviolet Radiation Physics,
   Cairns, AUSTRALIA, JUL 19-23, 2004}},
Abstract = {{We have investigated the bulk and surface electronic structures of
   Sm4As3 by using hard and soft X-ray photoemission spectroscopies (PESs).
   The valence band spectral shape changes much with photon energies (hvs)
   due to the variation of both photoionization cross sections and bulk
   sensitivity. PES with the wide range of hvs between 220 and 2450eV
   demonstrates that the valence of the Sm ions is definitely trivalent in
   the bulk and divalent at the surface. (c) 2004 Elsevier B.V. All rights
   reserved.}},
Publisher = {{ELSEVIER SCIENCE BV}},
Address = {{PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS}},
Type = {{Article; Proceedings Paper}},
Language = {{English}},
Affiliation = {{Yamasaki, A (Corresponding Author), Osaka Univ, Grad Sch Engn Sci, Toyonaka, Osaka 5608531, Japan.
   Osaka Univ, Grad Sch Engn Sci, Toyonaka, Osaka 5608531, Japan.
   Tohoku Univ, Grad Sch Sci, Sendai, Miyagi 9808578, Japan.
   Politecn Milan, Dipartimento Fis, INFM, I-20133 Milan, Italy.
   European Synchrotron Radiat Facil, F-38043 Grenoble, France.}},
DOI = {{10.1016/j.elspec.2005.01.017}},
ISSN = {{0368-2048}},
Keywords = {{photoemission; soft X-ray; hard X-ray; bulk sensitive; Sm4As3}},
Keywords-Plus = {{RESOLUTION RESONANCE PHOTOEMISSION; ELECTRONIC STATES; SM4BI3}},
Research-Areas = {{Spectroscopy}},
Web-of-Science-Categories  = {{Spectroscopy}},
Author-Email = {{yamasaki@decima.mp.es.osaka-u.ac.jp}},
ResearcherID-Numbers = {{Sekiyama, Akira/G-1851-2016
   Imada, Shin/F-1113-2014
   }},
ORCID-Numbers = {{Braicovich, Lucio/0000-0001-6548-9140}},
Number-of-Cited-References = {{9}},
Times-Cited = {{0}},
Usage-Count-Last-180-days = {{0}},
Usage-Count-Since-2013 = {{6}},
Journal-ISO = {{J. Electron Spectrosc. Relat. Phenom.}},
Doc-Delivery-Number = {{933TZ}},
Unique-ID = {{ISI:000229657100148}},
DA = {{2020-12-22}},
}

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