Study of bulk ground state properties of cerium intermetallics by linear dichroism in 4f resonant inelastic X-ray scattering

@article{ ISI:000174921600010,
Author = {Dallera, C and Marcon, M and Ghiringhelli, G and Tagliaferri, A and
   Brookes, NB and Olcese, G and Palenzona, A and Braicovich, L},
Title = {{Study of bulk ground state properties of cerium intermetallics by linear
   dichroism in 4f resonant inelastic X-ray scattering}},
Journal = {{SOLID STATE COMMUNICATIONS}},
Year = {{2002}},
Volume = {{121}},
Number = {{11}},
Pages = {{635-640}},
Abstract = {{We have measured polarization effects by 4f resonant inelastic X-ray
   scattering in the M-5 region of intermetallic compounds of cerium
   (CeRh2, CePd3, Ce7Rh3, and CeAl2). The experiment was performed using
   linearly polarized radiation with direction either perpendicular or
   parallel to the scattering plane. The dichroic effect is strong and
   depends on the degree of hybridization of the compound. We show that
   there is a monotonous relationship between the measured dichroism.
   integrated along the emitted energies, and the radius of the cerium ion
   in different compounds. Since the atomic size of cerium is directly
   related to its valence, we conclude that the linear dichroism in
   inelastic X-ray scattering is a bulk-sensitive indicator of the relative
   weight of the 4f(0) and 4f(1) ground state configurations of cerium
   compounds. (C) 2002 Published by Elsevier Science Ltd.}},
Publisher = {{PERGAMON-ELSEVIER SCIENCE LTD}},
Address = {{THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, ENGLAND}},
Type = {{Article}},
Language = {{English}},
Affiliation = {{Dallera, C (Corresponding Author), Politecn Milan, INFM, Dipartimento Fis, Piazza Leonardo Da Vinci 32, I-20133 Milan, Italy.
   Politecn Milan, INFM, Dipartimento Fis, I-20133 Milan, Italy.
   European Synchrotron Radiat Facil, F-38043 Grenoble, France.
   Univ Genoa, INFM, Dipartimento Chim & Chim Ind, I-16146 Genoa, Italy.}},
DOI = {{10.1016/S0038-1098(02)00030-3}},
Article-Number = {{PII S0038-1098(02)00030-3}},
ISSN = {{0038-1098}},
EISSN = {{1879-2766}},
Keywords = {{X-ray scattering; crystal structure and symmetry; electronic states
   (localized)}},
Keywords-Plus = {{POLARIZATION DEPENDENCE; EMISSION-SPECTROSCOPY; ELECTRONIC-STRUCTURE;
   RAMAN-SCATTERING; L EDGE; CE; PHOTOEMISSION; TRANSITION}},
Research-Areas = {{Physics}},
Web-of-Science-Categories  = {{Physics, Condensed Matter}},
Author-Email = {{claudia.dallera@fisi.polimi.it}},
ResearcherID-Numbers = {{Tagliaferri, Alberto/L-2903-2015
   Brookes, Nicholas B/C-6718-2019
   Marcon, Marco/AAX-4911-2020
   Ghiringhelli, Giacomo/D-1159-2014
   }},
ORCID-Numbers = {{Tagliaferri, Alberto/0000-0001-8001-1786
   Brookes, Nicholas B/0000-0002-1342-9530
   Marcon, Marco/0000-0001-6557-2120
   Ghiringhelli, Giacomo/0000-0003-0867-7748
   Braicovich, Lucio/0000-0001-6548-9140}},
Number-of-Cited-References = {{17}},
Times-Cited = {{3}},
Usage-Count-Last-180-days = {{0}},
Usage-Count-Since-2013 = {{8}},
Journal-ISO = {{Solid State Commun.}},
Doc-Delivery-Number = {{540GR}},
Unique-ID = {{ISI:000174921600010}},
DA = {{2020-12-22}},
}