by Chiuzbaian, SG, Ghiringhelli, G, Dallera, C, Grioni, M and Amann, P, Wang, X, Braicovich, L and Patthey, L
Abstract:
We studied the neutral electronic excitations of NiO localized at the Ni sites by measuring the resonant inelastic x-ray scattering (RIXS) spectra at the Ni M-2,M-3 edges. The good energy resolution allows an unambiguous identification of several spectral features due to dd excitations. The dependence of the RIXS spectra on the excitation energy gives evidence of local spin flip and yields a value of 125 +/- 15 meV for the antiferromagnetic exchange interaction. Accurate crystal field parameters are also obtained.
Reference:
Localized electronic excitations in NiO studied with resonant inelastic X-ray scattering at the Ni M threshold: Evidence of spin flip (Chiuzbaian, SG, Ghiringhelli, G, Dallera, C, Grioni, M and Amann, P, Wang, X, Braicovich, L and Patthey, L), In PHYSICAL REVIEW LETTERS, AMERICAN PHYSICAL SOC, volume 95, 2005.
Bibtex Entry:
@article{ ISI:000233062900063,
Author = {Chiuzbaian, SG and Ghiringhelli, G and Dallera, C and Grioni, M and
   Amann, P and Wang, X and Braicovich, L and Patthey, L},
Title = {{Localized electronic excitations in NiO studied with resonant inelastic
   X-ray scattering at the Ni M threshold: Evidence of spin flip}},
Journal = {{PHYSICAL REVIEW LETTERS}},
Year = {{2005}},
Volume = {{95}},
Number = {{19}},
Month = {{NOV 4}},
Abstract = {{We studied the neutral electronic excitations of NiO localized at the Ni
   sites by measuring the resonant inelastic x-ray scattering (RIXS)
   spectra at the Ni M-2,M-3 edges. The good energy resolution allows an
   unambiguous identification of several spectral features due to dd
   excitations. The dependence of the RIXS spectra on the excitation energy
   gives evidence of local spin flip and yields a value of 125 +/- 15 meV
   for the antiferromagnetic exchange interaction. Accurate crystal field
   parameters are also obtained.}},
Publisher = {{AMERICAN PHYSICAL SOC}},
Address = {{ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA}},
Type = {{Article}},
Language = {{English}},
Affiliation = {{Chiuzbaian, SG (Corresponding Author), Paul Scherrer Inst, CH-5232 Villigen, Switzerland.
   Paul Scherrer Inst, CH-5232 Villigen, Switzerland.
   Politecn Milan, INFM, Dipartimento Fis, I-20133 Milan, Italy.
   Ecole Polytech Fed Lausanne, IPN, CH-1015 Lausanne, Switzerland.}},
DOI = {{10.1103/PhysRevLett.95.197402}},
Article-Number = {{197402}},
ISSN = {{0031-9007}},
Keywords-Plus = {{EMISSION-SPECTROSCOPY; RAMAN-SCATTERING; SPECTRA}},
Research-Areas = {{Physics}},
Web-of-Science-Categories  = {{Physics, Multidisciplinary}},
Author-Email = {{gheorghe.chiuzbaian@psi.ch}},
ResearcherID-Numbers = {{Patthey, Luc/G-6130-2018
   Ghiringhelli, Giacomo/D-1159-2014
   }},
ORCID-Numbers = {{Patthey, Luc/0000-0001-6101-8069
   Ghiringhelli, Giacomo/0000-0003-0867-7748
   Braicovich, Lucio/0000-0001-6548-9140}},
Number-of-Cited-References = {{27}},
Times-Cited = {{59}},
Usage-Count-Last-180-days = {{0}},
Usage-Count-Since-2013 = {{19}},
Journal-ISO = {{Phys. Rev. Lett.}},
Doc-Delivery-Number = {{981BU}},
Unique-ID = {{ISI:000233062900063}},
OA = {{Green Published}},
DA = {{2020-12-22}},
}

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