by Chiuzbaian, SG, Ghiringhelli, G, Dallera, C, Grioni, M and Amann, P, Wang, X, Braicovich, L and Patthey, L
Abstract:
We studied the neutral electronic excitations of NiO localized at the Ni sites by measuring the resonant inelastic x-ray scattering (RIXS) spectra at the Ni M-2,M-3 edges. The good energy resolution allows an unambiguous identification of several spectral features due to dd excitations. The dependence of the RIXS spectra on the excitation energy gives evidence of local spin flip and yields a value of 125 +/- 15 meV for the antiferromagnetic exchange interaction. Accurate crystal field parameters are also obtained.
Reference:
Localized electronic excitations in NiO studied with resonant inelastic X-ray scattering at the Ni M threshold: Evidence of spin flip (Chiuzbaian, SG, Ghiringhelli, G, Dallera, C, Grioni, M and Amann, P, Wang, X, Braicovich, L and Patthey, L), In PHYSICAL REVIEW LETTERS, AMERICAN PHYSICAL SOC, volume 95, 2005.
Bibtex Entry:
@article{ ISI:000233062900063, Author = {Chiuzbaian, SG and Ghiringhelli, G and Dallera, C and Grioni, M and Amann, P and Wang, X and Braicovich, L and Patthey, L}, Title = {{Localized electronic excitations in NiO studied with resonant inelastic X-ray scattering at the Ni M threshold: Evidence of spin flip}}, Journal = {{PHYSICAL REVIEW LETTERS}}, Year = {{2005}}, Volume = {{95}}, Number = {{19}}, Month = {{NOV 4}}, Abstract = {{We studied the neutral electronic excitations of NiO localized at the Ni sites by measuring the resonant inelastic x-ray scattering (RIXS) spectra at the Ni M-2,M-3 edges. The good energy resolution allows an unambiguous identification of several spectral features due to dd excitations. The dependence of the RIXS spectra on the excitation energy gives evidence of local spin flip and yields a value of 125 +/- 15 meV for the antiferromagnetic exchange interaction. Accurate crystal field parameters are also obtained.}}, Publisher = {{AMERICAN PHYSICAL SOC}}, Address = {{ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA}}, Type = {{Article}}, Language = {{English}}, Affiliation = {{Chiuzbaian, SG (Corresponding Author), Paul Scherrer Inst, CH-5232 Villigen, Switzerland. Paul Scherrer Inst, CH-5232 Villigen, Switzerland. Politecn Milan, INFM, Dipartimento Fis, I-20133 Milan, Italy. Ecole Polytech Fed Lausanne, IPN, CH-1015 Lausanne, Switzerland.}}, DOI = {{10.1103/PhysRevLett.95.197402}}, Article-Number = {{197402}}, ISSN = {{0031-9007}}, Keywords-Plus = {{EMISSION-SPECTROSCOPY; RAMAN-SCATTERING; SPECTRA}}, Research-Areas = {{Physics}}, Web-of-Science-Categories = {{Physics, Multidisciplinary}}, Author-Email = {{gheorghe.chiuzbaian@psi.ch}}, ResearcherID-Numbers = {{Patthey, Luc/G-6130-2018 Ghiringhelli, Giacomo/D-1159-2014 }}, ORCID-Numbers = {{Patthey, Luc/0000-0001-6101-8069 Ghiringhelli, Giacomo/0000-0003-0867-7748 Braicovich, Lucio/0000-0001-6548-9140}}, Number-of-Cited-References = {{27}}, Times-Cited = {{59}}, Usage-Count-Last-180-days = {{0}}, Usage-Count-Since-2013 = {{19}}, Journal-ISO = {{Phys. Rev. Lett.}}, Doc-Delivery-Number = {{981BU}}, Unique-ID = {{ISI:000233062900063}}, OA = {{Green Published}}, DA = {{2020-12-22}}, }
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