by Kotani, A., Matsubara, M., Uozumi, T., Ghiringhelli, G. and Fracassi, F., Dallera, C., Tagliaferri, A. and Brookes, N. B. and Braicovich, L.
Abstract:
Resonant inelastic X-ray scattering (RIXS) spectra for Ni 2p to 3d excitation and 3d to 2p de-excitation of NiO are studied both theoretically and experimentally. Theoretical calculations with a single impurity Anderson model (SIAM) describe the charge transfer (CT) and d-d excitations in RIXS, and detailed study is made for the CT energy. High resolution RIXS measurements reveal the precise d-d excitation structure and its polarization dependence, and they are well reproduced by the SIAM calculation. (c) 2006 Elsevier Ltd. All rights reserved.
Reference:
Theoretical and experimental study of resonant inelastic X-ray scattering for NiO (Kotani, A., Matsubara, M., Uozumi, T., Ghiringhelli, G. and Fracassi, F., Dallera, C., Tagliaferri, A. and Brookes, N. B. and Braicovich, L.), In RADIATION PHYSICS AND CHEMISTRY, PERGAMON-ELSEVIER SCIENCE LTD, volume 75, 2006.
Bibtex Entry:
@article{ ISI:000242185600045, Author = {Kotani, A. and Matsubara, M. and Uozumi, T. and Ghiringhelli, G. and Fracassi, F. and Dallera, C. and Tagliaferri, A. and Brookes, N. B. and Braicovich, L.}, Title = {{Theoretical and experimental study of resonant inelastic X-ray scattering for NiO}}, Journal = {{RADIATION PHYSICS AND CHEMISTRY}}, Year = {{2006}}, Volume = {{75}}, Number = {{11}}, Pages = {{1670-1675}}, Month = {{NOV}}, Note = {{20th International Conference on X-Ray and Inner-Shell Processes, Univ Melbourne, Melbourne, AUSTRALIA, JUL 04-08, 2005}}, Abstract = {{Resonant inelastic X-ray scattering (RIXS) spectra for Ni 2p to 3d excitation and 3d to 2p de-excitation of NiO are studied both theoretically and experimentally. Theoretical calculations with a single impurity Anderson model (SIAM) describe the charge transfer (CT) and d-d excitations in RIXS, and detailed study is made for the CT energy. High resolution RIXS measurements reveal the precise d-d excitation structure and its polarization dependence, and they are well reproduced by the SIAM calculation. (c) 2006 Elsevier Ltd. All rights reserved.}}, Publisher = {{PERGAMON-ELSEVIER SCIENCE LTD}}, Address = {{THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, ENGLAND}}, Type = {{Article; Proceedings Paper}}, Language = {{English}}, Affiliation = {{Kotani, A (Corresponding Author), RIKEN, Harima Inst, 1-1-1 Kouto.Mikazuki Cho, Mikazuki, Hyogo 6795148, Japan. RIKEN, Harima Inst, Mikazuki, Hyogo 6795148, Japan. Inst Mat Struct Sci, Photon Factory, Tsukuba, Ibaraki 3050801, Japan. Aalto Univ, Phys Lab, FIN-02015 Helsinki, Finland. Osaka Prefecture Univ, Coll Engn, Sakai, Osaka 5998531, Japan. Politecn Milan, INFM, Dipartimento Fis, I-20133 Milan, Italy. European Synchrotron Radiat Facil, F-38043 Grenoble, France.}}, DOI = {{10.1016/j.radphyschem.2005.07.025}}, ISSN = {{0969-806X}}, Keywords = {{resonant inelastic X-ray scattering; NiO; charge transfer excitation; d-d excitation; single impurity Anderson model}}, Keywords-Plus = {{EMISSION-SPECTROSCOPY; SPECTRA}}, Research-Areas = {{Chemistry; Nuclear Science & Technology; Physics}}, Web-of-Science-Categories = {{Chemistry, Physical; Nuclear Science & Technology; Physics, Atomic, Molecular & Chemical}}, Author-Email = {{kotani@spring8.or.jp}}, ResearcherID-Numbers = {{Ghiringhelli, Giacomo/D-1159-2014 Brookes, Nicholas B/C-6718-2019 Matsubara, Masahiko/AAQ-3085-2020 Tagliaferri, Alberto/L-2903-2015 Uozumi, Takayuki/AAB-6532-2020 }}, ORCID-Numbers = {{Ghiringhelli, Giacomo/0000-0003-0867-7748 Brookes, Nicholas B/0000-0002-1342-9530 Matsubara, Masahiko/0000-0002-3608-6905 Tagliaferri, Alberto/0000-0001-8001-1786 Braicovich, Lucio/0000-0001-6548-9140}}, Funding-Acknowledgement = {{Grants-in-Aid for Scientific ResearchMinistry of Education, Culture, Sports, Science and Technology, Japan (MEXT)Japan Society for the Promotion of ScienceGrants-in-Aid for Scientific Research (KAKENHI) {[}17340097] Funding Source: KAKEN}}, Number-of-Cited-References = {{10}}, Times-Cited = {{7}}, Usage-Count-Last-180-days = {{0}}, Usage-Count-Since-2013 = {{5}}, Journal-ISO = {{Radiat. Phys. Chem.}}, Doc-Delivery-Number = {{107QH}}, Unique-ID = {{ISI:000242185600045}}, DA = {{2020-12-22}}, }
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